Reliability and modeling of gan-based light emitting diode

Hyunsoo Kim, Ji Myon Lee, Chul Huh, Sang Woo Kim, Dong Joon Kim, Seong Ju Park, Hyunsang Hwang

Research output: Contribution to conferencePaperpeer-review

1 Citation (Scopus)


The conditions for uniform current spreading during LED performance were modeled. A significant dependence in the current density on the LED reliability characteristics was observed. Further, it was possible to improve LED performance by adding an extra p-type pad.

Original languageEnglish
Number of pages2
Publication statusPublished - 2000
Event58th Device Research Conference (58th DRC) - Denver, CO, USA
Duration: 2000 Jun 192000 Jun 21


Conference58th Device Research Conference (58th DRC)
CityDenver, CO, USA

All Science Journal Classification (ASJC) codes

  • Engineering(all)


Dive into the research topics of 'Reliability and modeling of gan-based light emitting diode'. Together they form a unique fingerprint.

Cite this