Reliability and modeling of gan-based light emitting diode

Hyunsoo Kim; Ji Myon Lee; Chul Huh; Sang Woo Kim; Dong Joon Kim; Seong Ju Park; Hyunsang Hwang

Reliability and modeling of gan-based light emitting diode

Hyunsoo Kim, Ji Myon Lee, Chul Huh, Sang Woo Kim, Dong Joon Kim, Seong Ju Park, Hyunsang Hwang

Department of Materials Science and Engineering

Research output: Contribution to conference › Paper › peer-review

1 Citation (Scopus)

Abstract

The conditions for uniform current spreading during LED performance were modeled. A significant dependence in the current density on the LED reliability characteristics was observed. Further, it was possible to improve LED performance by adding an extra p-type pad.

Original language	English
Pages	73-74
Number of pages	2
Publication status	Published - 2000
Event	58th Device Research Conference (58th DRC) - Denver, CO, USA Duration: 2000 Jun 19 → 2000 Jun 21

Conference

Conference	58th Device Research Conference (58th DRC)
City	Denver, CO, USA
Period	00/6/19 → 00/6/21

All Science Journal Classification (ASJC) codes

Engineering(all)

Cite this

@conference{1d4042f40a514fba85b6e48df49832a9,

title = "Reliability and modeling of gan-based light emitting diode",

abstract = "The conditions for uniform current spreading during LED performance were modeled. A significant dependence in the current density on the LED reliability characteristics was observed. Further, it was possible to improve LED performance by adding an extra p-type pad.",

author = "Hyunsoo Kim and Lee, {Ji Myon} and Chul Huh and Kim, {Sang Woo} and Kim, {Dong Joon} and Park, {Seong Ju} and Hyunsang Hwang",

year = "2000",

language = "English",

pages = "73--74",

note = "58th Device Research Conference (58th DRC) ; Conference date: 19-06-2000 Through 21-06-2000",

}

TY - CONF

T1 - Reliability and modeling of gan-based light emitting diode

AU - Kim, Hyunsoo

AU - Lee, Ji Myon

AU - Huh, Chul

AU - Kim, Sang Woo

AU - Kim, Dong Joon

AU - Park, Seong Ju

AU - Hwang, Hyunsang

PY - 2000

Y1 - 2000

N2 - The conditions for uniform current spreading during LED performance were modeled. A significant dependence in the current density on the LED reliability characteristics was observed. Further, it was possible to improve LED performance by adding an extra p-type pad.

AB - The conditions for uniform current spreading during LED performance were modeled. A significant dependence in the current density on the LED reliability characteristics was observed. Further, it was possible to improve LED performance by adding an extra p-type pad.

UR - http://www.scopus.com/inward/record.url?scp=0033658796&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033658796&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0033658796

SP - 73

EP - 74

T2 - 58th Device Research Conference (58th DRC)

Y2 - 19 June 2000 through 21 June 2000

ER -

Reliability and modeling of gan-based light emitting diode

Abstract

Conference

All Science Journal Classification (ASJC) codes

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