Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability

Minchae Jung, Walid Saad, Youngrok Jang, Gyuyeol Kong, Sooyong Choi

Research output: Contribution to journalArticlepeer-review

45 Citations (Scopus)


Large intelligent surfaces (LISs) have been recently proposed as an effective wireless communication solution that can leverage antenna arrays deployed on the entirety of man-made structures such as walls. An LIS can provide space-intensive and reliable communication, enabling the desired wireless channel to exhibit a perfect line-of-sight. However, the outage probability of LIS, which is an important performance metric to evaluate the system reliability, remains uncharacterized. In this letter, the distribution of uplink sum-rate is asymptotically analyzed for an LIS system. Given the derived asymptotic distribution, the outage probability is derived for the considered LIS system. Simulation results show that the results of the proposed asymptotic analyses are in close agreement to the exact mutual information in the presence of a large number of antennas and devices.

Original languageEnglish
Article number8796421
Pages (from-to)1662-1666
Number of pages5
JournalIEEE Wireless Communications Letters
Issue number6
Publication statusPublished - 2019 Dec

Bibliographical note

Funding Information:
Manuscript received July 3, 2019; accepted August 11, 2019. Date of publication August 13, 2019; date of current version December 6, 2019. This work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education under Grant NRF-2016R1A6A3A11936259, and in part by the U.S. National Science Foundation under Grant CNS-1836802 and Grant OAC-1638283. The associate editor coordinating the review of this article and approving it for publication was Y. Gao. (Corresponding author: Sooyong Choi.) M. Jung, Y. Jang, G. Kong, and S. Choi are with the School of Electrical Electronic Engineering, Yonsei University, Seoul 03722, South Korea (e-mail:

Publisher Copyright:
© 2012 IEEE.

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering


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