Relationship between optical properties and microstructure of CeO 2-SiO2 composite thin films

Won Hoe Koo; Soon Moon Jeong; Sang Hun Choi; Hong Koo Baik; Se Jong Lee; Sung Man Lee

doi:10.1116/1.1782638

Relationship between optical properties and microstructure of CeO ₂-SiO₂ composite thin films

Won Hoe Koo, Soon Moon Jeong, Sang Hun Choi, Hong Koo Baik, Se Jong Lee, Sung Man Lee

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

The preparation of CeO₂-SiO₂ composite thin films using e-beam evaporation and ion beam assisted deposition was analyzed. It was observed that the refractive index of thin films exhibited a value at 20%-35%SiO₂ fraction which leads to high packing density. It was also observed that the composite thin films containing 20%-35%SiO₂ concentration had a dense and smooth amorphous surface. The results show that the composite thin films with 20%-35%SiO₂ concentration leads to a higher resistance to water absorption.

Original language	English
Pages (from-to)	2048-2051
Number of pages	4
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	22
Issue number	5
DOIs	https://doi.org/10.1116/1.1782638
Publication status	Published - 2004 Sept

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1116/1.1782638

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abstract = "The preparation of CeO2-SiO2 composite thin films using e-beam evaporation and ion beam assisted deposition was analyzed. It was observed that the refractive index of thin films exhibited a value at 20%-35%SiO2 fraction which leads to high packing density. It was also observed that the composite thin films containing 20%-35%SiO2 concentration had a dense and smooth amorphous surface. The results show that the composite thin films with 20%-35%SiO2 concentration leads to a higher resistance to water absorption.",

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AU - Koo, Won Hoe

AU - Jeong, Soon Moon

AU - Choi, Sang Hun

AU - Baik, Hong Koo

AU - Lee, Se Jong

AU - Lee, Sung Man

PY - 2004/9

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AB - The preparation of CeO2-SiO2 composite thin films using e-beam evaporation and ion beam assisted deposition was analyzed. It was observed that the refractive index of thin films exhibited a value at 20%-35%SiO2 fraction which leads to high packing density. It was also observed that the composite thin films containing 20%-35%SiO2 concentration had a dense and smooth amorphous surface. The results show that the composite thin films with 20%-35%SiO2 concentration leads to a higher resistance to water absorption.

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Relationship between optical properties and microstructure of CeO ₂-SiO₂ composite thin films

Abstract

All Science Journal Classification (ASJC) codes

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