Reflection-type confocal refractive index profile measurement method for optical waveguides: Effects of a broadband light source and multireflected lights

Youngchun Youk, Dug Young Kim

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We have investigated the effect of a broadband light source and back reflected light in a reflection-type confocal refractive index measurement system in detail. The effect of these factors was calculated, and a detailed analysis of the error sources was thoroughly examined. We have verified our calculated results with experiments by using a broadband light source and various index matching oils.

Original languageEnglish
Pages (from-to)74-79
Number of pages6
JournalOptics Communications
Volume277
Issue number1
DOIs
Publication statusPublished - 2007 Sept 1

Bibliographical note

Funding Information:
This work was supported by Creative Research Initiatives (3D Nano Optical Imaging Systems Research Group) of MOST/KOSEF.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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