Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair

Hayoung Lee; Donghyun Han; Hogyeong Kim; Sungho Kang

doi:10.1109/ISOCC50952.2020.9332931

Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair

Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

As the probability of fault occurrence increases with the advance of memory density and capacity, redundancy analysis (RA) is widely used for memory yield. However, the conventional RAs progress unnecessary solution search stages since they are applied per memory bank. It results in increase of the repair time. In this paper, redundancy analysis optimization with clustered known solutions (ROCK) is proposed for high speed repair. It progresses repair solution search considering multiple memory banks. During the repair solution search, RA using ROCK finds duplicated solution search stages based on a fault grouping method. After then, RA using ROCK enrolls the duplicated solution search stages as library and utilizes the library instead of progressing the duplicated solution search stages. It can highly reduce the repair time without any repair rate degradation.

Original language	English
Title of host publication	Proceedings - International SoC Design Conference, ISOCC 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	51-52
Number of pages	2
ISBN (Electronic)	9781728183312
DOIs	https://doi.org/10.1109/ISOCC50952.2020.9332931
Publication status	Published - 2020 Oct 21
Event	17th International System-on-Chip Design Conference, ISOCC 2020 - Yeosu, Korea, Republic of Duration: 2020 Oct 21 → 2020 Oct 24

Publication series

Name	Proceedings - International SoC Design Conference, ISOCC 2020

Conference

Conference	17th International System-on-Chip Design Conference, ISOCC 2020
Country/Territory	Korea, Republic of
City	Yeosu
Period	20/10/21 → 20/10/24

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

All Science Journal Classification (ASJC) codes

Energy Engineering and Power Technology
Electrical and Electronic Engineering
Instrumentation
Artificial Intelligence
Hardware and Architecture

Access to Document

10.1109/ISOCC50952.2020.9332931

Cite this

Lee, H., Han, D., Kim, H., & Kang, S. (2020). Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair. In Proceedings - International SoC Design Conference, ISOCC 2020 (pp. 51-52). Article 9332931 (Proceedings - International SoC Design Conference, ISOCC 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC50952.2020.9332931

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abstract = "As the probability of fault occurrence increases with the advance of memory density and capacity, redundancy analysis (RA) is widely used for memory yield. However, the conventional RAs progress unnecessary solution search stages since they are applied per memory bank. It results in increase of the repair time. In this paper, redundancy analysis optimization with clustered known solutions (ROCK) is proposed for high speed repair. It progresses repair solution search considering multiple memory banks. During the repair solution search, RA using ROCK finds duplicated solution search stages based on a fault grouping method. After then, RA using ROCK enrolls the duplicated solution search stages as library and utilizes the library instead of progressing the duplicated solution search stages. It can highly reduce the repair time without any repair rate degradation.",

author = "Hayoung Lee and Donghyun Han and Hogyeong Kim and Sungho Kang",

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Lee, H, Han, D, Kim, H & Kang, S 2020, Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair. in Proceedings - International SoC Design Conference, ISOCC 2020., 9332931, Proceedings - International SoC Design Conference, ISOCC 2020, Institute of Electrical and Electronics Engineers Inc., pp. 51-52, 17th International System-on-Chip Design Conference, ISOCC 2020, Yeosu, Korea, Republic of, 20/10/21. https://doi.org/10.1109/ISOCC50952.2020.9332931

Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair. / Lee, Hayoung; Han, Donghyun; Kim, Hogyeong et al.
Proceedings - International SoC Design Conference, ISOCC 2020. Institute of Electrical and Electronics Engineers Inc., 2020. p. 51-52 9332931 (Proceedings - International SoC Design Conference, ISOCC 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - As the probability of fault occurrence increases with the advance of memory density and capacity, redundancy analysis (RA) is widely used for memory yield. However, the conventional RAs progress unnecessary solution search stages since they are applied per memory bank. It results in increase of the repair time. In this paper, redundancy analysis optimization with clustered known solutions (ROCK) is proposed for high speed repair. It progresses repair solution search considering multiple memory banks. During the repair solution search, RA using ROCK finds duplicated solution search stages based on a fault grouping method. After then, RA using ROCK enrolls the duplicated solution search stages as library and utilizes the library instead of progressing the duplicated solution search stages. It can highly reduce the repair time without any repair rate degradation.

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Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair

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Bibliographical note

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