Redundancy analysis based on fault distribution for memory with complex spares

Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With the development of memory density and capacity, a redundancy analysis (RA) is widely used to improve memory yield. However, as the probability of fault occurrence on memory increases, repair rates of conventional RAs with a simple spare structure have been not enough to achieve a high memory yield. In this paper, redundancy analysis based on fault distribution (RAFD) for memory with complex spares is proposed to address the problem. It can obtain much higher repair rate than using conventional RAs with a simple spare structure by using complex spares. Also, although use of complex spares can cause analysis time increase but, RAFD solves the problem with the sequential spare allocations through consideration of fault distribution.

Original languageEnglish
Title of host publicationProceedings - 2019 International SoC Design Conference, ISOCC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages235-236
Number of pages2
ISBN (Electronic)9781728124780
DOIs
Publication statusPublished - 2019 Oct
Event16th International System-on-Chip Design Conference, ISOCC 2019 - Jeju, Korea, Republic of
Duration: 2019 Oct 62019 Oct 9

Publication series

NameProceedings - 2019 International SoC Design Conference, ISOCC 2019
Volume2019-January

Conference

Conference16th International System-on-Chip Design Conference, ISOCC 2019
Country/TerritoryKorea, Republic of
CityJeju
Period19/10/619/10/9

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Electrical and Electronic Engineering
  • Instrumentation
  • Artificial Intelligence
  • Hardware and Architecture

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