Abstract
We present a method to reduce the inherent errors caused by band-pass filter in off-axis quantitative phase microscopy and propose the optimum condition that can minimize these errors. We found that phase information of a sample in frequency domain nonlinearly oscillates as a function of the phase-shift correspond to the sample and its medium and the phase information of a sample inside the band-pass filter can be maximized by a proper phase-shift. Through numerical simulations and actual experiments, we demonstrate that the error in phase volume measurement can be effectively reduced by the enhancement of phase signal inside band-pass region using an optimum amount of phase that can be controlled by either changing medium index or wavelength of illumination.
Original language | English |
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Title of host publication | Practical Holography XXIX |
Subtitle of host publication | Materials and Applications |
Editors | Hans I. Bjelkhagen, V. Michael Bove |
Publisher | SPIE |
ISBN (Electronic) | 9781628414769 |
DOIs | |
Publication status | Published - 2015 |
Event | Practical Holography XXIX: Materials and Applications - San Francisco, United States Duration: 2015 Feb 8 → 2015 Feb 11 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 9386 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Other
Other | Practical Holography XXIX: Materials and Applications |
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Country/Territory | United States |
City | San Francisco |
Period | 15/2/8 → 15/2/11 |
Bibliographical note
Publisher Copyright:© 2015 SPIE.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering