Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift

Mohammad Reza Jafarfard; Behnam Tayebi; Razie Jalali Nasab; Dug Young Kim

doi:10.1117/12.2078681

Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift

Mohammad Reza Jafarfard, Behnam Tayebi, Razie Jalali Nasab, Dug Young Kim

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We present a method to reduce the inherent errors caused by band-pass filter in off-axis quantitative phase microscopy and propose the optimum condition that can minimize these errors. We found that phase information of a sample in frequency domain nonlinearly oscillates as a function of the phase-shift correspond to the sample and its medium and the phase information of a sample inside the band-pass filter can be maximized by a proper phase-shift. Through numerical simulations and actual experiments, we demonstrate that the error in phase volume measurement can be effectively reduced by the enhancement of phase signal inside band-pass region using an optimum amount of phase that can be controlled by either changing medium index or wavelength of illumination.

Original language	English
Title of host publication	Practical Holography XXIX
Subtitle of host publication	Materials and Applications
Editors	Hans I. Bjelkhagen, V. Michael Bove
Publisher	SPIE
ISBN (Electronic)	9781628414769
DOIs	https://doi.org/10.1117/12.2078681
Publication status	Published - 2015
Event	Practical Holography XXIX: Materials and Applications - San Francisco, United States Duration: 2015 Feb 8 → 2015 Feb 11

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9386
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Other

Other	Practical Holography XXIX: Materials and Applications
Country/Territory	United States
City	San Francisco
Period	15/2/8 → 15/2/11

Bibliographical note

Publisher Copyright:
© 2015 SPIE.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.2078681

Cite this

Jafarfard, M. R., Tayebi, B., Nasab, R. J., & Kim, D. Y. (2015). Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift. In H. I. Bjelkhagen, & V. M. Bove (Eds.), Practical Holography XXIX: Materials and Applications Article 2078681 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9386). SPIE. https://doi.org/10.1117/12.2078681

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title = "Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift",

abstract = "We present a method to reduce the inherent errors caused by band-pass filter in off-axis quantitative phase microscopy and propose the optimum condition that can minimize these errors. We found that phase information of a sample in frequency domain nonlinearly oscillates as a function of the phase-shift correspond to the sample and its medium and the phase information of a sample inside the band-pass filter can be maximized by a proper phase-shift. Through numerical simulations and actual experiments, we demonstrate that the error in phase volume measurement can be effectively reduced by the enhancement of phase signal inside band-pass region using an optimum amount of phase that can be controlled by either changing medium index or wavelength of illumination.",

author = "Jafarfard, {Mohammad Reza} and Behnam Tayebi and Nasab, {Razie Jalali} and Kim, {Dug Young}",

note = "Publisher Copyright: {\textcopyright} 2015 SPIE.; Practical Holography XXIX: Materials and Applications ; Conference date: 08-02-2015 Through 11-02-2015",

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doi = "10.1117/12.2078681",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

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Jafarfard, MR, Tayebi, B, Nasab, RJ & Kim, DY 2015, Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift. in HI Bjelkhagen & VM Bove (eds), Practical Holography XXIX: Materials and Applications., 2078681, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9386, SPIE, Practical Holography XXIX: Materials and Applications, San Francisco, United States, 15/2/8. https://doi.org/10.1117/12.2078681

Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift. / Jafarfard, Mohammad Reza; Tayebi, Behnam; Nasab, Razie Jalali et al.
Practical Holography XXIX: Materials and Applications. ed. / Hans I. Bjelkhagen; V. Michael Bove. SPIE, 2015. 2078681 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9386).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - We present a method to reduce the inherent errors caused by band-pass filter in off-axis quantitative phase microscopy and propose the optimum condition that can minimize these errors. We found that phase information of a sample in frequency domain nonlinearly oscillates as a function of the phase-shift correspond to the sample and its medium and the phase information of a sample inside the band-pass filter can be maximized by a proper phase-shift. Through numerical simulations and actual experiments, we demonstrate that the error in phase volume measurement can be effectively reduced by the enhancement of phase signal inside band-pass region using an optimum amount of phase that can be controlled by either changing medium index or wavelength of illumination.

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Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift

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