@inproceedings{5a7c4f2cfae041cda107b905d6221a1e,
title = "Raman analysis of in-plane biaxial strain for Ge-on-Si lasers",
abstract = "Tensile strain of Ge-on-Si with post-growth annealing was analyzed using micro-Raman for optical sources in interconnection system. Tensile Stain in epi-Ge distributed non-linearly with SiGe alloy formation at the interface after annealing.",
author = "Bugeun Ki and Jiwoong Baek and Chulwon Lee and Cho, {Yong Hoon} and Jungwoo Oh",
year = "2016",
month = jan,
day = "7",
doi = "10.1109/CLEOPR.2015.7375928",
language = "English",
series = "2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015",
address = "United States",
note = "11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 ; Conference date: 24-08-2015 Through 28-08-2015",
}