Process variation in near-threshold wide SIMD architectures

Sangwon Seo, Ronald G. Dreslinski, Mark Woh, Yongjun Park, Chaitali Charkrabari, Scott Mahlke, David Blaauw, Trevor Mudge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

39 Citations (Scopus)


Near-threshold operation has emerged as a competitive approach for energy-efficient architecture design. In particular, a combination of near-threshold circuit techniques and parallel SIMD computations achieves excellent energy efficiency for easy-to-parallelize applications. However, near-threshold operations suffer from delay variations due to increased process variability. This is exacerbated in wide SIMD architectures where the number of critical paths are multiplied by the SIMD width. This paper provides a systematic in-depth study of delay variations in near-threshold operations and shows that simple techniques such as structural duplication and supply voltage/frequency margining are sufficient to mitigate the timing variation problems in wide SIMD architectures at the cost of marginal area and power overhead.

Original languageEnglish
Title of host publicationProceedings of the 49th Annual Design Automation Conference, DAC '12
Number of pages8
Publication statusPublished - 2012
Event49th Annual Design Automation Conference, DAC '12 - San Francisco, CA, United States
Duration: 2012 Jun 32012 Jun 7

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X


Conference49th Annual Design Automation Conference, DAC '12
Country/TerritoryUnited States
CitySan Francisco, CA

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modelling and Simulation


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