TY - JOUR
T1 - Printable ferroelectric PVDF/PMMA blend films with ultralow roughness for low voltage non-volatile polymer memory
AU - Kang, Seok Ju
AU - Park, Youn Jung
AU - Bae, Insung
AU - Kim, Kap Jin
AU - Kim, Ho Cheol
AU - Bauer, Siegfried
AU - Thomas, Edwin L.
AU - Park, Cheolmin
PY - 2009/9/9
Y1 - 2009/9/9
N2 - Here, a facile route to fabricate thin ferroelectric polyvinylidene fluoride) (PVDF)/poly(methylmethacrylate) (PMMA) blend films with very low surface roughness based on spin-coating and subsequent melt-quenching is described. Amorphous PMMA in a blend film effectively retards the rapid crystallization of PVDF upon quenching, giving rise to a thin and flat ferroelectric film with nanometer scale β-type PVDF crystals. The still, flat interfaces of the blend film with metal electrode and/or an organic semiconducting channel layer enable fabrication of a highly reliable ferroelectric capacitor and transistor memory unit operating at voltages as low as 15 V. For instance, with a TIPS-pentacene single crystal as an active semi-conducting layer, a flexible ferroelectric field effect transistor shows a clockwise I-V hysteresis with a drain current bistability of 103 and data retention time of more than 15h at ±15 V gate voltage. Furthermore, the robust interfacial homogeneity of the ferroelectric film is highly beneficial for transfer printing in which arrays of metal/ferroelectric/metal micro-capacitors are developed over a large area with well defined edge sharpness.
AB - Here, a facile route to fabricate thin ferroelectric polyvinylidene fluoride) (PVDF)/poly(methylmethacrylate) (PMMA) blend films with very low surface roughness based on spin-coating and subsequent melt-quenching is described. Amorphous PMMA in a blend film effectively retards the rapid crystallization of PVDF upon quenching, giving rise to a thin and flat ferroelectric film with nanometer scale β-type PVDF crystals. The still, flat interfaces of the blend film with metal electrode and/or an organic semiconducting channel layer enable fabrication of a highly reliable ferroelectric capacitor and transistor memory unit operating at voltages as low as 15 V. For instance, with a TIPS-pentacene single crystal as an active semi-conducting layer, a flexible ferroelectric field effect transistor shows a clockwise I-V hysteresis with a drain current bistability of 103 and data retention time of more than 15h at ±15 V gate voltage. Furthermore, the robust interfacial homogeneity of the ferroelectric film is highly beneficial for transfer printing in which arrays of metal/ferroelectric/metal micro-capacitors are developed over a large area with well defined edge sharpness.
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U2 - 10.1002/adfm.200900589
DO - 10.1002/adfm.200900589
M3 - Article
AN - SCOPUS:69949155612
SN - 1616-301X
VL - 19
SP - 2812
EP - 2818
JO - Advanced Functional Materials
JF - Advanced Functional Materials
IS - 17
ER -