Precise Identification of Graphene’s Crystal Structures by Removable Nanowire Epitaxy

Jonghyeok Kim, Kitaek Lim, Yangjin Lee, Jongin Kim, Kihwan Kim, Jungwon Park, Kwanpyo Kim, Won Chul Lee

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


Monitoring crystallographic orientations of graphene is important for the reliable generation of graphene-based nanostructures such as van der Waals heterostructures and graphene nanoribbons because their physical properties are dependent on crystal structures. However, facile and precise identification of graphene’s crystallographic orientations is still challenging because the majority of current tools rely on complex atomic-scale imaging. Here, we present an identification method for the crystal orientations and grain boundaries of graphene using the directional alignment between epitaxially grown AuCN nanowires and the underlying graphene. Because the nanowires are visible in scanning electron microscopy, crystal orientations of graphene can be inspected with simple procedures. Kernel density estimation that we used in analyzing the nanowire directions enables precise measurement of graphene’s crystal orientations. We also confirm that the imaged nanowires can be simply removed without degrading graphene’s quality, thus showing that the present method can be practically used for measuring graphene’s crystal structures.

Original languageEnglish
Pages (from-to)1302-1309
Number of pages8
JournalJournal of Physical Chemistry Letters
Issue number6
Publication statusPublished - 2017 Mar 16

Bibliographical note

Publisher Copyright:
© 2017 American Chemical Society.

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • Physical and Theoretical Chemistry


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