Physical-aware gating element insertion for thermal-safe scan shift operation

Taehee Lee, Joon Sung Yang

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.

Original languageEnglish
Article number20161181
Journalieice electronics express
Issue number7
Publication statusPublished - 2017 Mar 21

Bibliographical note

Publisher Copyright:
© IEICE 2017.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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