Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.
Bibliographical notePublisher Copyright:
© IEICE 2017.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering