P-Backtracking: A new scan chain diagnosis method with probability

Tae Hyun Kim, Hyun Yul Liin, Simgho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Scan chain architecture is a common and major DFT for SoCs. Scan chains must be flawless for reliable SoC test. If there is a fault in a scan chain, eliminating the fault and its cause is important for high yield of SoC. In this paper, a new scan chain diagnosis method, "p-backtracking", is proposed. This method uses only software to backtrack the logic circuit and calculates the probability of fault in scan chain. The experimental results using ISC AS'89 benchmark circuits show that p- backtracking can find single fault location with higher diagnosis accuracy and smaller diagnosis resolution compared to the conventional diagnosis methods.

Original languageEnglish
Title of host publicationISOCC 2016 - International SoC Design Conference
Subtitle of host publicationSmart SoC for Intelligent Things
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages2
ISBN (Electronic)9781467393089
Publication statusPublished - 2016 Dec 27
Event13th International SoC Design Conference, ISOCC 2016 - Jeju, Korea, Republic of
Duration: 2016 Oct 232016 Oct 26

Publication series

NameISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things


Other13th International SoC Design Conference, ISOCC 2016
Country/TerritoryKorea, Republic of

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea govemment(MSIP) (No. 2015R1A2A1A13001751).

Publisher Copyright:
© 2016 IEEE.

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Instrumentation


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