P-Backtracking: A new scan chain diagnosis method with probability

Tae Hyun Kim; Hyun Yul Liin; Simgho Kang

doi:10.1109/ISOCC.2016.7799827

P-Backtracking: A new scan chain diagnosis method with probability

Tae Hyun Kim, Hyun Yul Liin, Simgho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Scan chain architecture is a common and major DFT for SoCs. Scan chains must be flawless for reliable SoC test. If there is a fault in a scan chain, eliminating the fault and its cause is important for high yield of SoC. In this paper, a new scan chain diagnosis method, "p-backtracking", is proposed. This method uses only software to backtrack the logic circuit and calculates the probability of fault in scan chain. The experimental results using ISC AS'89 benchmark circuits show that p- backtracking can find single fault location with higher diagnosis accuracy and smaller diagnosis resolution compared to the conventional diagnosis methods.

Original language	English
Title of host publication	ISOCC 2016 - International SoC Design Conference
Subtitle of host publication	Smart SoC for Intelligent Things
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	141-142
Number of pages	2
ISBN (Electronic)	9781467393089
DOIs	https://doi.org/10.1109/ISOCC.2016.7799827
Publication status	Published - 2016 Dec 27
Event	13th International SoC Design Conference, ISOCC 2016 - Jeju, Korea, Republic of Duration: 2016 Oct 23 → 2016 Oct 26

Publication series

Name	ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things

Other

Other	13th International SoC Design Conference, ISOCC 2016
Country/Territory	Korea, Republic of
City	Jeju
Period	16/10/23 → 16/10/26

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea govemment(MSIP) (No. 2015R1A2A1A13001751).

Publisher Copyright:
© 2016 IEEE.

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/ISOCC.2016.7799827

Cite this

Kim, T. H., Liin, H. Y., & Kang, S. (2016). P-Backtracking: A new scan chain diagnosis method with probability. In ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things (pp. 141-142). [7799827] (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2016.7799827

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title = "P-Backtracking: A new scan chain diagnosis method with probability",

abstract = "Scan chain architecture is a common and major DFT for SoCs. Scan chains must be flawless for reliable SoC test. If there is a fault in a scan chain, eliminating the fault and its cause is important for high yield of SoC. In this paper, a new scan chain diagnosis method, {"}p-backtracking{"}, is proposed. This method uses only software to backtrack the logic circuit and calculates the probability of fault in scan chain. The experimental results using ISC AS'89 benchmark circuits show that p- backtracking can find single fault location with higher diagnosis accuracy and smaller diagnosis resolution compared to the conventional diagnosis methods.",

author = "Kim, {Tae Hyun} and Liin, {Hyun Yul} and Simgho Kang",

note = "Funding Information: This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea govemment(MSIP) (No. 2015R1A2A1A13001751). Publisher Copyright: {\textcopyright} 2016 IEEE.; 13th International SoC Design Conference, ISOCC 2016 ; Conference date: 23-10-2016 Through 26-10-2016",

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day = "27",

doi = "10.1109/ISOCC.2016.7799827",

language = "English",

series = "ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Kim, TH, Liin, HY & Kang, S 2016, P-Backtracking: A new scan chain diagnosis method with probability. in ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things., 7799827, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things, Institute of Electrical and Electronics Engineers Inc., pp. 141-142, 13th International SoC Design Conference, ISOCC 2016, Jeju, Korea, Republic of, 16/10/23. https://doi.org/10.1109/ISOCC.2016.7799827

P-Backtracking: A new scan chain diagnosis method with probability. / Kim, Tae Hyun; Liin, Hyun Yul; Kang, Simgho.
ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., 2016. p. 141-142 7799827 (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Kim, Tae Hyun

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N1 - Funding Information: This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea govemment(MSIP) (No. 2015R1A2A1A13001751). Publisher Copyright: © 2016 IEEE.

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N2 - Scan chain architecture is a common and major DFT for SoCs. Scan chains must be flawless for reliable SoC test. If there is a fault in a scan chain, eliminating the fault and its cause is important for high yield of SoC. In this paper, a new scan chain diagnosis method, "p-backtracking", is proposed. This method uses only software to backtrack the logic circuit and calculates the probability of fault in scan chain. The experimental results using ISC AS'89 benchmark circuits show that p- backtracking can find single fault location with higher diagnosis accuracy and smaller diagnosis resolution compared to the conventional diagnosis methods.

AB - Scan chain architecture is a common and major DFT for SoCs. Scan chains must be flawless for reliable SoC test. If there is a fault in a scan chain, eliminating the fault and its cause is important for high yield of SoC. In this paper, a new scan chain diagnosis method, "p-backtracking", is proposed. This method uses only software to backtrack the logic circuit and calculates the probability of fault in scan chain. The experimental results using ISC AS'89 benchmark circuits show that p- backtracking can find single fault location with higher diagnosis accuracy and smaller diagnosis resolution compared to the conventional diagnosis methods.

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Kim TH, Liin HY, Kang S. P-Backtracking: A new scan chain diagnosis method with probability. In ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc. 2016. p. 141-142. 7799827. (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things). doi: 10.1109/ISOCC.2016.7799827

P-Backtracking: A new scan chain diagnosis method with probability

Abstract

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