Orthogonal filter banks with region Log-TiedRank covariance matrices for face recognition

Cong Jie Ng, Cheng Yaw Low, Kar Ann Toh, Jaihie Kim, Andrew Beng Jin Teoh

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

With the capability of fusing varying features from a specific image region, the Region Covariance Matrices (RCM) image descriptor has been evidenced plausible in face recognition. However, a systematic study for RCM, regarding which features to be fused in particular, remains absent. This paper therefore explores several features derived from the orthogonal filter ensembles, i.e., Identity Transform, Discrete Haar Transform, Discrete Cosine Transform, and Karhunen-Loève Transform, for feature encoding in RCM. Aside from that, we also outline a RCM variant, dubbed Region Log-TiedRank Covariance Matrices (RLTCM) in this paper. The RLTCM descriptor, on average, exhibits dramatic performance gain over RCM as well as state-of-the-art descriptors, especially when probe sets far deviated from the face gallery. Furthermore, we discern that the RLTCM descriptor defined based on Identity Transform, i.e., the simplest form of orthogonal filters, and other learning-free orthogonal filters yield impressive performance on par with the learning-based counterparts.

Original languageEnglish
Pages (from-to)548-560
Number of pages13
JournalJournal of Visual Communication and Image Representation
Volume55
DOIs
Publication statusPublished - 2018 Aug

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government ( MSIP ) ( NO. 2016R1A2B4011656 ).

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (NO. 2016R1A2B4011656).

Publisher Copyright:
© 2018 Elsevier Inc.

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Media Technology
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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