Abstract
Wavelet analysis of voltage sag completely depends on the choice of the wavelet basis. For better detection performance via wavelet analysis, the choice of the optimal wavelet basis must be provided within the constraints of the uncertainty principle which restricts arbitrary assignment of time-frequency resolution. In this paper, we describe local properties of the wavelet basis and voltage sag signal in terms of time duration and frequency bandwidth parameters. After comparison of the local properties of the wavelet basis and voltage sag signal, we suggest a set of performance indexes to measure the time-frequency resolution relation between the wavelet basis and the voltage sag signal. This procedure of determining the optimal wavelet basis can be extended to other possible applications of wavelets.
| Original language | English |
|---|---|
| Pages (from-to) | 873-883 |
| Number of pages | 11 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3813 |
| Publication status | Published - 1999 |
| Event | Proceedings of the 1999 Wavelet Applications in Signal and Image Processing VII - Denver, CO, USA Duration: 1999 Jul 19 → 1999 Jul 23 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering