Optical trapping with a perfect vortex beam

Mingzhou Chen, Michael Mazilu, Yoshihiko Arita, Ewan M. Wright, Kishan Dholakia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

21 Citations (Scopus)

Abstract

Vortex beams with different topological charge usually have different profiles and radii of peak intensity. This introduces a degree of complexity the fair study of the nature of optical OAM (orbital angular momentum). To avoid this, we introduced a new approach by creating a perfect vortex beam using an annular illuminating beam with a fixed intensity profile on an SLM that imposes a chosen topological charge. The radial intensity profile of such an experimentally created perfect vortex beam is independent to any given integer value of its topological charge. The well-defined OAM density in such a perfect vortex beam is probed by trapping microscope particles. The rotation rate of a trapped necklace of particles is measured for both integer and non-integer topological charge. Experimental results agree with the theoretical prediction. With the flexibility of our approach, local OAM density can be corrected in situ to overcome the problem of trapping the particle in the intensity hotspots. The correction of local OAM density in the perfect vortex beam therefore enables a single trapped particle to move along the vortex ring at a constant angular velocity that is independent of the azimuthal position. Due to its particular nature, the perfect vortex beam may be applied to other studies in optical trapping of particles, atoms or quantum gases.

Original languageEnglish
Title of host publicationOptical Trapping and Optical Micromanipulation XI
EditorsGabriel C. Spalding, Kishan Dholakia
PublisherSPIE
ISBN (Electronic)9781628411911
DOIs
Publication statusPublished - 2014
EventOptical Trapping and Optical Micromanipulation XI - San Diego, United States
Duration: 2014 Aug 172014 Aug 21

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9164
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Trapping and Optical Micromanipulation XI
Country/TerritoryUnited States
CitySan Diego
Period14/8/1714/8/21

Bibliographical note

Publisher Copyright:
© 2014 SPIE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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