OpenNVM: An open-sourced FPGA-based NVM controller for low level memory characterization

Jie Zhang, Gieseo Park, Mustafa M. Shihab, David Donofrio, John Shalf, Myoungsoo Jung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Citations (Scopus)

Abstract

Accurate characterization of real device samples is essential for understanding the true potential of the emerging non-volatile memories (NVMs) and identifying their optimal placement in the memory hierarchy. Even though, NVM devices are now available from different manufacturers, lack of an appropriate NVM controller and evaluation platform in the public domain is the main challenge in extracting empirical data from these real devices. In this paper, we present Open-NVM, an open-sourced, highly configurable FPGA based evaluation/characterization platform for various NVM technologies. Through our OpenNVM, this work reveals important low-level NVM characteristics, including i) static and dynamic latency disparity, ii) error rate variation, iii) power consumption behavior, vi) interrelationship between frequency and NVM operational current. In addition, we also examine state-of-The-Art write-once-memory (WOM) codes on a real NVM device and study diverse system-level performance impacts based on our findings. All FPGA source code and detailed information of our hardware design is ready to be open-sourced and downloaded for free.

Original languageEnglish
Title of host publicationProceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages666-673
Number of pages8
ISBN (Electronic)9781467371650
DOIs
Publication statusPublished - 2015 Dec 14
Event33rd IEEE International Conference on Computer Design, ICCD 2015 - New York City, United States
Duration: 2015 Oct 182015 Oct 21

Publication series

NameProceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015

Other

Other33rd IEEE International Conference on Computer Design, ICCD 2015
Country/TerritoryUnited States
CityNew York City
Period15/10/1815/10/21

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

All Science Journal Classification (ASJC) codes

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications

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