Open-Set Face Identification on Few-Shot Gallery by Fine-Tuning

Hojin Park, Jaewoo Park, Andrew Beng Jin Teoh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we focus on addressing the open-set face identification problem on a few-shot gallery by finetuning. The problem assumes a realistic scenario for face identification, where only a small number of face images is given for enrollment and any unknown identity must be rejected during identification. We observe that face recognition models pretrained on a large dataset and naively fine-tuned models perform poorly for this task. Motivated by this issue, we propose an effective fine-tuning scheme with classifier weight imprinting and exclusive BatchNorm layer tuning. For further improvement of rejection accuracy on unknown identities, we propose a novel matcher called Neighborhood Aware Cosine (NAC) that computes similarity based on neighborhood information. We validate the effectiveness of the proposed schemes thoroughly on large-scale face benchmarks across different convolutional neural network architectures. The source code for this project is available at: https://github.com/1ho0jin1/OSFI-by-FineTuning

Original languageEnglish
Title of host publication2022 26th International Conference on Pattern Recognition, ICPR 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1026-1032
Number of pages7
ISBN (Electronic)9781665490627
DOIs
Publication statusPublished - 2022
Event26th International Conference on Pattern Recognition, ICPR 2022 - Montreal, Canada
Duration: 2022 Aug 212022 Aug 25

Publication series

NameProceedings - International Conference on Pattern Recognition
Volume2022-August
ISSN (Print)1051-4651

Conference

Conference26th International Conference on Pattern Recognition, ICPR 2022
Country/TerritoryCanada
CityMontreal
Period22/8/2122/8/25

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition

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