Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

Y. Park; T. J. Ahn; Y. H. Kim; W. T. Han; U. C. Paek; D. Y. Kim

Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

Y. Park, T. J. Ahn, Y. H. Kim, W. T. Han, U. C. Paek, D. Y. Kim

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8µm.

Original language	English
Title of host publication	Optical Fiber Communication Conference, OFC 2001
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Electronic)	9781557528209
Publication status	Published - 2001
Event	Optical Fiber Communication Conference, OFC 2001 - Anaheim, United States Duration: 2001 Mar 17 → …

Publication series

Name	Optics InfoBase Conference Papers

Conference

Conference	Optical Fiber Communication Conference, OFC 2001
Country/Territory	United States
City	Anaheim
Period	01/3/17 → …

Bibliographical note

Publisher Copyright:
© 2001 OSA/OFC 2001, © 2000 Optical Society of America.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Mechanics of Materials

Cite this

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title = "Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber",

abstract = "A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8µm.",

author = "Y. Park and Ahn, {T. J.} and Kim, {Y. H.} and Han, {W. T.} and Paek, {U. C.} and Kim, {D. Y.}",

note = "Publisher Copyright: {\textcopyright} 2001 OSA/OFC 2001, {\textcopyright} 2000 Optical Society of America.; Optical Fiber Communication Conference, OFC 2001 ; Conference date: 17-03-2001",

year = "2001",

language = "English",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "Optical Fiber Communication Conference, OFC 2001",

}

Park, Y, Ahn, TJ, Kim, YH, Han, WT, Paek, UC & Kim, DY 2001, Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber. in Optical Fiber Communication Conference, OFC 2001., TuM4, Optics InfoBase Conference Papers, Optica Publishing Group (formerly OSA), Optical Fiber Communication Conference, OFC 2001, Anaheim, United States, 01/3/17.

Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber. / Park, Y.; Ahn, T. J.; Kim, Y. H. et al.
Optical Fiber Communication Conference, OFC 2001. Optica Publishing Group (formerly OSA), 2001. TuM4 (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

AU - Park, Y.

AU - Ahn, T. J.

AU - Kim, Y. H.

AU - Han, W. T.

AU - Paek, U. C.

AU - Kim, D. Y.

PY - 2001

Y1 - 2001

N2 - A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8µm.

AB - A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8µm.

UR - http://www.scopus.com/inward/record.url?scp=85135608305&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85135608305&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85135608305

T3 - Optics InfoBase Conference Papers

BT - Optical Fiber Communication Conference, OFC 2001

PB - Optica Publishing Group (formerly OSA)

T2 - Optical Fiber Communication Conference, OFC 2001

Y2 - 17 March 2001

ER -

Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

Abstract

Publication series

Conference

Bibliographical note

All Science Journal Classification (ASJC) codes

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