Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

Y. Park; T. J. Ahn; Y. H. Kim; W. T. Han; U. C. Paek; D. Y. Kim

Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

Y. Park, T. J. Ahn, Y. H. Kim, W. T. Han, U. C. Paek, D. Y. Kim

Department of Physics

Research output: Contribution to conference › Paper › peer-review

8 Citations (Scopus)

Abstract

A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8μm.

Original language	English
Pages	TuM4/1-TuM4/3
Publication status	Published - 2001
Event	Optical Fiber Communication Conference - Anaheim, CA, United States Duration: 2001 Mar 17 → 2001 Mar 22

Other

Other	Optical Fiber Communication Conference
Country/Territory	United States
City	Anaheim, CA
Period	01/3/17 → 01/3/22

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

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title = "Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber",

abstract = "A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8μm.",

author = "Y. Park and Ahn, {T. J.} and Kim, {Y. H.} and Han, {W. T.} and Paek, {U. C.} and Kim, {D. Y.}",

year = "2001",

language = "English",

pages = "TuM4/1--TuM4/3",

note = "Optical Fiber Communication Conference ; Conference date: 17-03-2001 Through 22-03-2001",

}

TY - CONF

T1 - Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

AU - Park, Y.

AU - Ahn, T. J.

AU - Kim, Y. H.

AU - Han, W. T.

AU - Paek, U. C.

AU - Kim, D. Y.

PY - 2001

Y1 - 2001

N2 - A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8μm.

AB - A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8μm.

UR - http://www.scopus.com/inward/record.url?scp=18344418510&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=18344418510&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:18344418510

SP - TuM4/1-TuM4/3

T2 - Optical Fiber Communication Conference

Y2 - 17 March 2001 through 22 March 2001

ER -

Novel technique for measuring the residual stress and the photoelastic effect profile of an optical fiber

Abstract

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All Science Journal Classification (ASJC) codes

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