Abstract
Improvement of structured illumination microscopy (SIM) to remove grid pattern noise was investigated by applying notch spatial filters in the Fourier domain. We have acquired wide-field and SIM images of pollen grains and evaluated multiple reconstruction schemes on a quantitative basis. The results suggest that grid pattern noise can be reduced substantially to be smaller than that of standard SIM by more than 18 times, at the expense of little overhead in the reconstruction time. Also, if notch spatial filters are used in combination with subtractive reconstruction, the overall image quality can be enhanced by almost ten times, compared to standard SIM.
| Original language | English |
|---|---|
| Pages (from-to) | 142-146 |
| Number of pages | 5 |
| Journal | Optics Communications |
| Volume | 308 |
| DOIs | |
| Publication status | Published - 2013 |
Bibliographical note
Funding Information:Acknowledgements. We thank Ms. Ulla Kiiski and Ms. Asja Mile-tic for skillful technical assistance and Ms. Marja-Leena Rissanen for skilled secretarial help. M.S.-B. was a recipient of a short-term fellowship from the Programme on Developmental Biology of the European Science Foundation. This work was supported by the Medical Research Council of the Academy of Finland, the Uni-
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering