Abstract
Electronic transport properties of a heterostructure junction made of two different multiwall carbon nanotubes are studied. Independent measurement of the current-voltage characteristics of each nanotube revealed that both of them were lightly p-doped semiconductors with energy gaps whose magnitudes are widely different from each other. The current-voltage characteristics measured across the heterojunction show reproducible rectifying diode behavior. The forward bias current across the heterojunction increases rapidly with the application of a positive gate bias voltage, implying an n -type gate response.
Original language | English |
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Pages (from-to) | 1351-1353 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 79 |
Issue number | 9 |
DOIs | |
Publication status | Published - 2001 Aug 27 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)