Noise analysis in magnetic resonance electrical impedance tomography at 3 and 11 T field strengths

Rosalind Sadleir, Samuel Grant, Uk Zhang Sung, Il Lee Byung, Chan Pyo Hyun, Hoon Oh Suk, Chunjae Park, Je Woo Eung, Yeol Lee Soo, Ohin Kwon, Keun Seo Jin

Research output: Contribution to journalArticlepeer-review

88 Citations (Scopus)


In magnetic resonance electrical impedance tomography (MREIT), we measure the induced magnetic flux density inside an object subject to an externally injected current. This magnetic flux density is contaminated with noise, which ultimately limits the quality of reconstructed conductivity and current density images. By analysing and experimentally verifying the amount of noise in images gathered from two MREIT systems, we found that a carefully designed MREIT study will be able to reduce noise levels below 0.25 and 0.05 nT at main magnetic field strengths of 3 and 11 T, respectively, at a voxel size of 3 x 3 x 3 mm3. Further noise level reductions can be achieved by optimizing MREIT pulse sequences and using signal averaging. We suggest two different methods to estimate magnetic flux noise levels, and the results are compared to validate the experimental setup of an MREIT system.

Original languageEnglish
Pages (from-to)875-884
Number of pages10
JournalPhysiological measurement
Issue number5
Publication statusPublished - 2005 Oct 1

All Science Journal Classification (ASJC) codes

  • Biophysics
  • Physiology
  • Biomedical Engineering
  • Physiology (medical)


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