New scan design of asynchronous sequential circuits

Yong Seok Kang; Kyung Hoi Huh; Sungho Kang

doi:10.1109/APASIC.1999.824102

New scan design of asynchronous sequential circuits

Yong Seok Kang, Kyung Hoi Huh, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing.

Original language	English
Title of host publication	AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	355-358
Number of pages	4
ISBN (Print)	0780357051, 9780780357051
DOIs	https://doi.org/10.1109/APASIC.1999.824102
Publication status	Published - 1999
Event	1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999 - Seoul, Korea, Republic of Duration: 1999 Aug 23 → 1999 Aug 25

Publication series

Name	AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs

Other

Other	1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999
Country/Territory	Korea, Republic of
City	Seoul
Period	99/8/23 → 99/8/25

Bibliographical note

Funding Information:
This research was supported by Samsung Electronics Co., Ltd.

Publisher Copyright:
© 1999 IEEE.

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/APASIC.1999.824102

Cite this

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title = "New scan design of asynchronous sequential circuits",

abstract = "In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing.",

author = "Kang, {Yong Seok} and Huh, {Kyung Hoi} and Sungho Kang",

note = "Funding Information: This research was supported by Samsung Electronics Co., Ltd. Publisher Copyright: {\textcopyright} 1999 IEEE.; 1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999 ; Conference date: 23-08-1999 Through 25-08-1999",

year = "1999",

doi = "10.1109/APASIC.1999.824102",

language = "English",

isbn = "0780357051",

series = "AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "355--358",

booktitle = "AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs",

address = "United States",

}

Kang, YS, Huh, KH & Kang, S 1999, New scan design of asynchronous sequential circuits. in AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs., 824102, AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs, Institute of Electrical and Electronics Engineers Inc., pp. 355-358, 1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999, Seoul, Korea, Republic of, 99/8/23. https://doi.org/10.1109/APASIC.1999.824102

New scan design of asynchronous sequential circuits. / Kang, Yong Seok; Huh, Kyung Hoi; Kang, Sungho.
AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs. Institute of Electrical and Electronics Engineers Inc., 1999. p. 355-358 824102 (AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Kang, Yong Seok

AU - Huh, Kyung Hoi

AU - Kang, Sungho

PY - 1999

Y1 - 1999

N2 - In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing.

AB - In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing.

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DO - 10.1109/APASIC.1999.824102

M3 - Conference contribution

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T3 - AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs

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BT - AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs

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T2 - 1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999

Y2 - 23 August 1999 through 25 August 1999

ER -

New scan design of asynchronous sequential circuits

Abstract

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Bibliographical note

All Science Journal Classification (ASJC) codes

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