TY - GEN
T1 - New fault detection algorithm for multi-level cell flash memories
AU - Cha, Jaewon
AU - Kim, Ilwoong
AU - Kang, Sungho
PY - 2011
Y1 - 2011
N2 - With a development of high-capacity flash memory, a variety of applications have been featured in the current market. Since the density per unit area of multi-level cell flash memory (MLC), is doubled compared with single level cell flash memory (SLC), the MLC is widely used in flash memory. However, it is difficult to efficiently test the MLC. In order to test the MLC with low test time and low test cost, a new test algorithm for the MLC is proposed. The performance of the proposed algorithm is better than existing algorithms.
AB - With a development of high-capacity flash memory, a variety of applications have been featured in the current market. Since the density per unit area of multi-level cell flash memory (MLC), is doubled compared with single level cell flash memory (SLC), the MLC is widely used in flash memory. However, it is difficult to efficiently test the MLC. In order to test the MLC with low test time and low test cost, a new test algorithm for the MLC is proposed. The performance of the proposed algorithm is better than existing algorithms.
UR - http://www.scopus.com/inward/record.url?scp=84856187970&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84856187970&partnerID=8YFLogxK
U2 - 10.1109/ATS.2011.13
DO - 10.1109/ATS.2011.13
M3 - Conference contribution
AN - SCOPUS:84856187970
SN - 9780769545837
T3 - Proceedings of the Asian Test Symposium
SP - 341
EP - 346
BT - Proceedings of the 20th Asian Test Symposium, ATS 2011
T2 - 20th Asian Test Symposium, ATS 2011
Y2 - 20 November 2011 through 23 November 2011
ER -