Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition

Young Don Ko; Hong Seong Kang; Min Chang Jeong; Sang Yeol Lee; Jae Min Myoung; Ilgu Yun

doi:10.1109/IMFEDK.2004.1566417

Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition

Young Don Ko, Hong Seong Kang, Min Chang Jeong, Sang Yeol Lee, Jae Min Myoung, Ilgu Yun

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this study the D-optimal design was used to make design matrix in this experiment. Neural networks (NNets) based on the backpropagation (BP) algorithm are applied to the pulsed laser deposition (PLD) process modeling in order to construct the model for the growth rate of the ZnO thin films.

Original language	English
Title of host publication	IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai
Editors	Hiroshi Nozawa
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	79-80
Number of pages	2
ISBN (Electronic)	0780384237, 9780780384231
DOIs	https://doi.org/10.1109/IMFEDK.2004.1566417
Publication status	Published - 2004
Event	2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 - Kyoto, Japan Duration: 2004 Jul 26 → 2004 Jul 28

Publication series

Name	IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai

Other

Other	2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004
Country/Territory	Japan
City	Kyoto
Period	04/7/26 → 04/7/28

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/IMFEDK.2004.1566417

Cite this

Ko, Y. D., Kang, H. S., Jeong, M. C., Lee, S. Y., Myoung, J. M., & Yun, I. (2004). Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. In H. Nozawa (Ed.), IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai (pp. 79-80). Article 1566417 (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMFEDK.2004.1566417

Ko, Young Don ; Kang, Hong Seong ; Jeong, Min Chang et al. / Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. editor / Hiroshi Nozawa. Institute of Electrical and Electronics Engineers Inc., 2004. pp. 79-80 (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai).

@inproceedings{702cee9cc7c549c1a79064ddbfd6b501,

title = "Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition",

abstract = "In this study the D-optimal design was used to make design matrix in this experiment. Neural networks (NNets) based on the backpropagation (BP) algorithm are applied to the pulsed laser deposition (PLD) process modeling in order to construct the model for the growth rate of the ZnO thin films.",

author = "Ko, {Young Don} and Kang, {Hong Seong} and Jeong, {Min Chang} and Lee, {Sang Yeol} and Myoung, {Jae Min} and Ilgu Yun",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 ; Conference date: 26-07-2004 Through 28-07-2004",

year = "2004",

doi = "10.1109/IMFEDK.2004.1566417",

language = "English",

series = "IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "79--80",

editor = "Hiroshi Nozawa",

booktitle = "IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai",

address = "United States",

}

Ko, YD, Kang, HS, Jeong, MC, Lee, SY, Myoung, JM & Yun, I 2004, Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. in H Nozawa (ed.), IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai., 1566417, IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai, Institute of Electrical and Electronics Engineers Inc., pp. 79-80, 2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004, Kyoto, Japan, 04/7/26. https://doi.org/10.1109/IMFEDK.2004.1566417

Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. / Ko, Young Don; Kang, Hong Seong; Jeong, Min Chang et al.
IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. ed. / Hiroshi Nozawa. Institute of Electrical and Electronics Engineers Inc., 2004. p. 79-80 1566417 (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition

AU - Ko, Young Don

AU - Kang, Hong Seong

AU - Jeong, Min Chang

AU - Lee, Sang Yeol

AU - Myoung, Jae Min

AU - Yun, Ilgu

PY - 2004

Y1 - 2004

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AB - In this study the D-optimal design was used to make design matrix in this experiment. Neural networks (NNets) based on the backpropagation (BP) algorithm are applied to the pulsed laser deposition (PLD) process modeling in order to construct the model for the growth rate of the ZnO thin films.

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T3 - IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai

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BT - IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai

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PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004

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Ko YD, Kang HS, Jeong MC, Lee SY, Myoung JM , Yun I. Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. In Nozawa H, editor, IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Institute of Electrical and Electronics Engineers Inc. 2004. p. 79-80. 1566417. (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai). doi: 10.1109/IMFEDK.2004.1566417

Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition

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