The use of an alignment layer between liquid crystals (LCs) and solution-processed inorganic materials has been studied primarily for its application to next generation display technologies. However, solution-processing results in porous films and defects. In this study, we used hafnium (IV) oxide (HfO2) alignment films in a multi-stacked layer (MSL) for a high performance device. Laminating the layer more, the density of the films and smoothed their roughness. These effects resulted from the low trapping rate of electrons and holes in the MSL. Therefore, the LCs were well-aligned in the MSL-based devices.
|Journal||ECS Solid State Letters|
|Publication status||Published - 2014|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering