Multi-Class Data Description for Out-of-distribution Detection

Dongha Lee, Sehun Yu, Hwanjo Yu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

The capability of reliably detecting out-of-distribution samples is one of the key factors in deploying a good classifier, as the test distribution always does not match with the training distribution in most real-world applications. In this work, we present a deep multi-class data description, termed as Deep-MCDD, which is effective to detect out-of-distribution (OOD) samples as well as classify in-distribution (ID) samples. Unlike the softmax classifier that only focuses on the linear decision boundary partitioning its latent space into multiple regions, our Deep-MCDD aims to find a spherical decision boundary for each class which determines whether a test sample belongs to the class or not. By integrating the concept of Gaussian discriminant analysis into deep neural networks, we propose a deep learning objective to learn class-conditional distributions that are explicitly modeled as separable Gaussian distributions. Thereby, we can define the confidence score by the distance of a test sample from each class-conditional distribution, and utilize it for identifying OOD samples. Our empirical evaluation on multi-class tabular and image datasets demonstrates that Deep-MCDD achieves the best performances in distinguishing OOD samples while showing the classification accuracy as high as the other competitors.

Original languageEnglish
Title of host publicationKDD 2020 - Proceedings of the 26th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
PublisherAssociation for Computing Machinery
Pages1362-1370
Number of pages9
ISBN (Electronic)9781450379984
DOIs
Publication statusPublished - 2020 Aug 23
Event26th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2020 - Virtual, Online, United States
Duration: 2020 Aug 232020 Aug 27

Publication series

NameProceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining

Conference

Conference26th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2020
Country/TerritoryUnited States
CityVirtual, Online
Period20/8/2320/8/27

Bibliographical note

Publisher Copyright:
© 2020 ACM.

All Science Journal Classification (ASJC) codes

  • Software
  • Information Systems

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