Modeling of self-heating effect for depletion-type Si micro-ring modulator

Yoojin Ban; Byung Min Yu; Jinsoo Rhim; Jeong Min Lee; Woo Young Choi

doi:10.1109/OIC.2015.7115722

Modeling of self-heating effect for depletion-type Si micro-ring modulator

Yoojin Ban, Byung Min Yu, Jinsoo Rhim, Jeong Min Lee, Woo Young Choi

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

We present an accurate model for self-heating effect in depletion-type Si micro-ring modulator which describes incident-power dependent transmission and dynamics. Its accuracy is confirmed with measurement. It can be useful for determining optimal modulation conditions.

Original language	English
Title of host publication	2015 IEEE Optical Interconnects Conference, OI 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	134-135
Number of pages	2
ISBN (Electronic)	9781479981793
DOIs	https://doi.org/10.1109/OIC.2015.7115722
Publication status	Published - 2015 May 29
Event	2015 IEEE Optical Interconnects Conference, OI 2015 - San Diego, United States Duration: 2015 Apr 20 → 2015 Apr 22

Publication series

Name	2015 IEEE Optical Interconnects Conference, OI 2015

Other

Other	2015 IEEE Optical Interconnects Conference, OI 2015
Country/Territory	United States
City	San Diego
Period	15/4/20 → 15/4/22

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Computer Networks and Communications
Hardware and Architecture
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

Access to Document

10.1109/OIC.2015.7115722

Cite this

Ban, Y., Yu, B. M., Rhim, J., Lee, J. M., & Choi, W. Y. (2015). Modeling of self-heating effect for depletion-type Si micro-ring modulator. In 2015 IEEE Optical Interconnects Conference, OI 2015 (pp. 134-135). [7115722] (2015 IEEE Optical Interconnects Conference, OI 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OIC.2015.7115722

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title = "Modeling of self-heating effect for depletion-type Si micro-ring modulator",

abstract = "We present an accurate model for self-heating effect in depletion-type Si micro-ring modulator which describes incident-power dependent transmission and dynamics. Its accuracy is confirmed with measurement. It can be useful for determining optimal modulation conditions.",

author = "Yoojin Ban and Yu, {Byung Min} and Jinsoo Rhim and Lee, {Jeong Min} and Choi, {Woo Young}",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 2015 IEEE Optical Interconnects Conference, OI 2015 ; Conference date: 20-04-2015 Through 22-04-2015",

year = "2015",

month = may,

day = "29",

doi = "10.1109/OIC.2015.7115722",

language = "English",

series = "2015 IEEE Optical Interconnects Conference, OI 2015",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "134--135",

booktitle = "2015 IEEE Optical Interconnects Conference, OI 2015",

address = "United States",

}

Ban, Y, Yu, BM, Rhim, J, Lee, JM & Choi, WY 2015, Modeling of self-heating effect for depletion-type Si micro-ring modulator. in 2015 IEEE Optical Interconnects Conference, OI 2015., 7115722, 2015 IEEE Optical Interconnects Conference, OI 2015, Institute of Electrical and Electronics Engineers Inc., pp. 134-135, 2015 IEEE Optical Interconnects Conference, OI 2015, San Diego, United States, 15/4/20. https://doi.org/10.1109/OIC.2015.7115722

Modeling of self-heating effect for depletion-type Si micro-ring modulator. / Ban, Yoojin; Yu, Byung Min; Rhim, Jinsoo et al.
2015 IEEE Optical Interconnects Conference, OI 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 134-135 7115722 (2015 IEEE Optical Interconnects Conference, OI 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Modeling of self-heating effect for depletion-type Si micro-ring modulator

AU - Ban, Yoojin

AU - Yu, Byung Min

AU - Rhim, Jinsoo

AU - Lee, Jeong Min

AU - Choi, Woo Young

PY - 2015/5/29

Y1 - 2015/5/29

N2 - We present an accurate model for self-heating effect in depletion-type Si micro-ring modulator which describes incident-power dependent transmission and dynamics. Its accuracy is confirmed with measurement. It can be useful for determining optimal modulation conditions.

AB - We present an accurate model for self-heating effect in depletion-type Si micro-ring modulator which describes incident-power dependent transmission and dynamics. Its accuracy is confirmed with measurement. It can be useful for determining optimal modulation conditions.

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DO - 10.1109/OIC.2015.7115722

M3 - Conference contribution

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T3 - 2015 IEEE Optical Interconnects Conference, OI 2015

SP - 134

EP - 135

BT - 2015 IEEE Optical Interconnects Conference, OI 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2015 IEEE Optical Interconnects Conference, OI 2015

Y2 - 20 April 2015 through 22 April 2015

ER -

Modeling of self-heating effect for depletion-type Si micro-ring modulator

Abstract

Publication series

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Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

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