TY - JOUR
T1 - Microwave dielectric properties of Bi2O3-doped Ca[(Li1/3Nb2/3)1-xTix] O3-δ ceramics
AU - Ha, Jong Yoon
AU - Choi, Ji Won
AU - Yoon, Seok Jin
AU - Choi, Doo Jin
AU - Yoon, Ki Hyun
AU - Kim, Hyun Jai
PY - 2003
Y1 - 2003
N2 - The effect of the additive on the densification, low temperature sintering, and microwave dielectric properties of the Ca[(Li1/3Nb2/3)1-x Tix]O3-δ(CLNT) was investigated. Bi2O3 addition improved the densification and reduced the sintering temperature from 1150 to 900 °C of CLNT microwave dielectric ceramics. As the Bi2O3 content increased, the dielectric constant (εr) and bulk density increased. The quality factor (Q·f0), however, was decreased slightly. The temperature coefficient of resonant frequency (τf) shifted to a positive value with increasing Bi2O3 content. The dielectric properties (εr, Q·f0, τf) of Ca[(Li1/3Nb2/3)0.95Ti0.05] O3-δ and Ca[(Li1/3 Nb2/3)0.8 Ti0.2]O3-δ with 5 wt.% Bi2O3 sintered at 900 °C for 3 were 20, 6500 GHz, -4 ppm/°C, and 35, 11,000 GHz, 13 ppm/°, respectively. The relationship between the microstructure and dielectric properties was studied by X-ray diffraction (XRD), and SEM.
AB - The effect of the additive on the densification, low temperature sintering, and microwave dielectric properties of the Ca[(Li1/3Nb2/3)1-x Tix]O3-δ(CLNT) was investigated. Bi2O3 addition improved the densification and reduced the sintering temperature from 1150 to 900 °C of CLNT microwave dielectric ceramics. As the Bi2O3 content increased, the dielectric constant (εr) and bulk density increased. The quality factor (Q·f0), however, was decreased slightly. The temperature coefficient of resonant frequency (τf) shifted to a positive value with increasing Bi2O3 content. The dielectric properties (εr, Q·f0, τf) of Ca[(Li1/3Nb2/3)0.95Ti0.05] O3-δ and Ca[(Li1/3 Nb2/3)0.8 Ti0.2]O3-δ with 5 wt.% Bi2O3 sintered at 900 °C for 3 were 20, 6500 GHz, -4 ppm/°C, and 35, 11,000 GHz, 13 ppm/°, respectively. The relationship between the microstructure and dielectric properties was studied by X-ray diffraction (XRD), and SEM.
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U2 - 10.1016/S0955-2219(03)00162-6
DO - 10.1016/S0955-2219(03)00162-6
M3 - Article
AN - SCOPUS:0042190323
SN - 0955-2219
VL - 23
SP - 2413
EP - 2416
JO - Journal of the European Ceramic Society
JF - Journal of the European Ceramic Society
IS - 14
ER -