Microstructure analysis of epitaxially grown self-assembled Ge islands on nanometer-scale patterned SiO2 Si substrates by high-resolution transmission electron microscopy

Tae Sik Yoon, Hyun Mi Kim, Ki Bum Kim, Du Yeol Ryu, Thomas P. Russell, Zuoming Zhao, Jian Liu, Ya Hong Xie

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

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