Memory-like Defect Diagnosis for CMOL FPGAs

Jihye Kim; Hayoung Lee; Seokjun Jang; Hogyeong Kim; Sungho Kang

doi:10.1109/ISOCC50952.2020.9332927

Memory-like Defect Diagnosis for CMOL FPGAs

Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using reconfiguration due to its high defect rate. To bypass defect elements, accurate defect diagnosis is important for circuit configuration. CMOL FPGAs are circuit structures combining advantages of CMOS and nanotechnology. In this paper, an accurate defect diagnosis method for CMOL FPGAs using an operation similar to the read of CMOL memory are proposed.

Original language	English
Title of host publication	Proceedings - International SoC Design Conference, ISOCC 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	139-140
Number of pages	2
ISBN (Electronic)	9781728183312
DOIs	https://doi.org/10.1109/ISOCC50952.2020.9332927
Publication status	Published - 2020 Oct 21
Event	17th International System-on-Chip Design Conference, ISOCC 2020 - Yeosu, Korea, Republic of Duration: 2020 Oct 21 → 2020 Oct 24

Publication series

Name	Proceedings - International SoC Design Conference, ISOCC 2020

Conference

Conference	17th International System-on-Chip Design Conference, ISOCC 2020
Country/Territory	Korea, Republic of
City	Yeosu
Period	20/10/21 → 20/10/24

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2019R1A2C3011079).

Publisher Copyright:
© 2020 IEEE.

All Science Journal Classification (ASJC) codes

Energy Engineering and Power Technology
Electrical and Electronic Engineering
Instrumentation
Artificial Intelligence
Hardware and Architecture

Access to Document

10.1109/ISOCC50952.2020.9332927

Cite this

@inproceedings{fa531f656b364abeba9730cf8a34a80c,

title = "Memory-like Defect Diagnosis for CMOL FPGAs",

abstract = "Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using reconfiguration due to its high defect rate. To bypass defect elements, accurate defect diagnosis is important for circuit configuration. CMOL FPGAs are circuit structures combining advantages of CMOS and nanotechnology. In this paper, an accurate defect diagnosis method for CMOL FPGAs using an operation similar to the read of CMOL memory are proposed.",

author = "Jihye Kim and Hayoung Lee and Seokjun Jang and Hogyeong Kim and Sungho Kang",

note = "Funding Information: This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2019R1A2C3011079). Publisher Copyright: {\textcopyright} 2020 IEEE.; 17th International System-on-Chip Design Conference, ISOCC 2020 ; Conference date: 21-10-2020 Through 24-10-2020",

year = "2020",

month = oct,

day = "21",

doi = "10.1109/ISOCC50952.2020.9332927",

language = "English",

series = "Proceedings - International SoC Design Conference, ISOCC 2020",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "139--140",

booktitle = "Proceedings - International SoC Design Conference, ISOCC 2020",

address = "United States",

}

Kim, J, Lee, H, Jang, S, Kim, H & Kang, S 2020, Memory-like Defect Diagnosis for CMOL FPGAs. in Proceedings - International SoC Design Conference, ISOCC 2020., 9332927, Proceedings - International SoC Design Conference, ISOCC 2020, Institute of Electrical and Electronics Engineers Inc., pp. 139-140, 17th International System-on-Chip Design Conference, ISOCC 2020, Yeosu, Korea, Republic of, 20/10/21. https://doi.org/10.1109/ISOCC50952.2020.9332927

Memory-like Defect Diagnosis for CMOL FPGAs. / Kim, Jihye; Lee, Hayoung; Jang, Seokjun et al.
Proceedings - International SoC Design Conference, ISOCC 2020. Institute of Electrical and Electronics Engineers Inc., 2020. p. 139-140 9332927 (Proceedings - International SoC Design Conference, ISOCC 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Memory-like Defect Diagnosis for CMOL FPGAs

AU - Kim, Jihye

AU - Lee, Hayoung

AU - Jang, Seokjun

AU - Kim, Hogyeong

AU - Kang, Sungho

N1 - Funding Information: This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2019R1A2C3011079). Publisher Copyright: © 2020 IEEE.

PY - 2020/10/21

Y1 - 2020/10/21

N2 - Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using reconfiguration due to its high defect rate. To bypass defect elements, accurate defect diagnosis is important for circuit configuration. CMOL FPGAs are circuit structures combining advantages of CMOS and nanotechnology. In this paper, an accurate defect diagnosis method for CMOL FPGAs using an operation similar to the read of CMOL memory are proposed.

AB - Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using reconfiguration due to its high defect rate. To bypass defect elements, accurate defect diagnosis is important for circuit configuration. CMOL FPGAs are circuit structures combining advantages of CMOS and nanotechnology. In this paper, an accurate defect diagnosis method for CMOL FPGAs using an operation similar to the read of CMOL memory are proposed.

UR - http://www.scopus.com/inward/record.url?scp=85100767254&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85100767254&partnerID=8YFLogxK

U2 - 10.1109/ISOCC50952.2020.9332927

DO - 10.1109/ISOCC50952.2020.9332927

M3 - Conference contribution

AN - SCOPUS:85100767254

T3 - Proceedings - International SoC Design Conference, ISOCC 2020

SP - 139

EP - 140

BT - Proceedings - International SoC Design Conference, ISOCC 2020

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 17th International System-on-Chip Design Conference, ISOCC 2020

Y2 - 21 October 2020 through 24 October 2020

ER -

Memory-like Defect Diagnosis for CMOL FPGAs

Abstract

Publication series

Conference

Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

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