Measurement of Friction Force between Directly Integrated Carbon Nanotube Bundles in Tip-to-Tip Contact Using MEMS Tribometer Platform

Wondo Kim, Eunhwan Jo, Jae Ik Lee, Jongbaeg Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, by using MEMS tribometer platform, we measured static and dynamic friction force between carbon nanotube (CNT) bundles in tip-to-tip contact. The MEMS tribometer platform consists of two shuttles which can have tangential motion relative to the reference shuttle and two comb-drive actuators that can apply normal and tangential force, respectively. Vertically aligned and self-adjusted CNT bundles were directly grown on a designated location in MEMS tribometer platform forming a uniform contact area. By gradually increasing tangential force while observing displacement of each shuttle, we were able to differentiate between static and dynamic friction regime and calculate corresponding friction forces.

Original languageEnglish
Title of host publication2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems, MEMS 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages845-848
Number of pages4
ISBN (Electronic)9781728116105
DOIs
Publication statusPublished - 2019 Jan
Event32nd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2019 - Seoul, Korea, Republic of
Duration: 2019 Jan 272019 Jan 31

Publication series

NameProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
Volume2019-January
ISSN (Print)1084-6999

Conference

Conference32nd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2019
Country/TerritoryKorea, Republic of
CitySeoul
Period19/1/2719/1/31

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea(NRF) grant funded by the Korea government(MSIT)(No. NRF-2018R1A2A1A05023070).

Publisher Copyright:
© 2019 IEEE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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