Abstract
We report on the fabrication of pentacene thin-film transistors (TFTs) with a poly-4-vinylphenol (PVP)yttrium oxide (YOx) PVP triple-layer dielectric deposited on an indium-tin oxide (ITO)/plastic substrate. Our PVP YOx PVP triple layer exhibited 2 orders of magnitude lower gate current leakage than that of a PVP YOx double layer because the former has a PVP buffer to cope with the irregular surfaces of the ITO/plastic substrate. Adopting the triple-layer dielectric, our pentacene TFTs with NiOx and Au source/drain electrodes exhibited high field mobilities of ∼1.37 and 0.84 cm2 V s, respectively, under low driving voltage conditions (less than -8 V). We conclude that our triple-layer approach is quite a promising and practical way to realize a flexible low-voltage high-performance organic TFT on ITO/plastic substrates with rough surfaces.
Original language | English |
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Pages (from-to) | H117-H119 |
Journal | Electrochemical and Solid-State Letters |
Volume | 10 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2007 |
All Science Journal Classification (ASJC) codes
- Chemical Engineering(all)
- Materials Science(all)
- Physical and Theoretical Chemistry
- Electrochemistry
- Electrical and Electronic Engineering