Abstract
There has been much research about STED microscopy to reduce cost. In that microscopy, it is necessary to synchronize the pulsed lights which is just for initial setup. However, there has not been researched in order to reduce this expense until now. So, in this paper, we propose the low-cost strategy to measure the time delay in STED microscopy. To achieve that, we utilized TCSPC principle with a general digital oscilloscope. As a result, we attained successful measurement and adjustment about two pulsed lights with 180-ps delay in STED system.
Original language | English |
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Title of host publication | MOC 2015 - Technical Digest of 20th Microoptics Conference |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9784863485433 |
DOIs | |
Publication status | Published - 2016 Feb 23 |
Event | 20th Microoptics Conference, MOC 2015 - Fukuoka, Japan Duration: 2015 Oct 25 → 2015 Oct 28 |
Publication series
Name | MOC 2015 - Technical Digest of 20th Microoptics Conference |
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Other
Other | 20th Microoptics Conference, MOC 2015 |
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Country/Territory | Japan |
City | Fukuoka |
Period | 15/10/25 → 15/10/28 |
Bibliographical note
Funding Information:This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korean government (NRF-2013R1A2A1A01016979).
Publisher Copyright:
© 2015 The Japan Society of Applied Physics.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials