Abstract
In this paper, a new test pattern generator with a 2-level LFSR and a fast pattern transferring method for the scan-based BIST structure are proposed. XOR input paths in the 2-level LFSR scheme are changed by counter outputs to generate less linear-dependent and auto-correlated test patterns for better fault coverage. Test patterns are transferred into the scan chain by using an asynchronous internal high frequency clock to reduce test time.
| Original language | English |
|---|---|
| Pages (from-to) | IV1-IV4 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 626 |
| Publication status | Published - 2001 |
| Event | Thermoelectric Materials 2000-The Next Generation Materials for Small-Scale Refrigeration and Power Generation Applications - San Francisco, CA, United States Duration: 2000 Apr 24 → 2000 Apr 27 |
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering