Low cost and high efficient BIST scheme with 2-level LFSR and APTP

S. M. Yoo, S. O. Jung, S. M. Kang

Research output: Contribution to journalConference articlepeer-review


In this paper, a new test pattern generator with a 2-level LFSR and a fast pattern transferring method for the scan-based BIST structure are proposed. XOR input paths in the 2-level LFSR scheme are changed by counter outputs to generate less linear-dependent and auto-correlated test patterns for better fault coverage. Test patterns are transferred into the scan chain by using an asynchronous internal high frequency clock to reduce test time.

Original languageEnglish
Pages (from-to)IV1-IV4
JournalMaterials Research Society Symposium - Proceedings
Publication statusPublished - 2001
EventThermoelectric Materials 2000-The Next Generation Materials for Small-Scale Refrigeration and Power Generation Applications - San Francisco, CA, United States
Duration: 2000 Apr 242000 Apr 27

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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