TY - JOUR
T1 - Local Bit-Line SRAM Architecture With Data-Aware Power-Gating Write Assist
AU - Oh, Tae Woo
AU - Park, Juhyun
AU - Kim, Tae Hyun
AU - Cho, Keonhee
AU - Jung, Seong Ook
N1 - Publisher Copyright:
© 2004-2012 IEEE.
PY - 2023/1/1
Y1 - 2023/1/1
N2 - In this brief, a local bit-line (LBL) SRAM with data-aware power-gating write assist is proposed for near-threshold operation. The proposed SRAM achieves high read stability and write ability by adopting LBL architecture and power-gating transistors, respectively. Depending on the input data, one of the power-gating transistors is adaptively cut off, which eliminates the write disturbance from the power supply. Thus, reliable write operation can be performed. The proposed SRAM achieves a read stability yield of 5.12σ, write ability yield of 7.26σ, and consumes 0.21 pJ energy/operation with 58% shorter read delay and 33% smaller area per bit than the 12T SRAM at a supply voltage of 0.4 V in a 22-nm FinFET process.
AB - In this brief, a local bit-line (LBL) SRAM with data-aware power-gating write assist is proposed for near-threshold operation. The proposed SRAM achieves high read stability and write ability by adopting LBL architecture and power-gating transistors, respectively. Depending on the input data, one of the power-gating transistors is adaptively cut off, which eliminates the write disturbance from the power supply. Thus, reliable write operation can be performed. The proposed SRAM achieves a read stability yield of 5.12σ, write ability yield of 7.26σ, and consumes 0.21 pJ energy/operation with 58% shorter read delay and 33% smaller area per bit than the 12T SRAM at a supply voltage of 0.4 V in a 22-nm FinFET process.
KW - Data-aware power-gating write assist
KW - FinFET
KW - near-threshold operation
KW - static random access memory (SRAM)
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U2 - 10.1109/TCSII.2022.3206478
DO - 10.1109/TCSII.2022.3206478
M3 - Article
AN - SCOPUS:85139450131
SN - 1549-7747
VL - 70
SP - 306
EP - 310
JO - IEEE Transactions on Circuits and Systems II: Express Briefs
JF - IEEE Transactions on Circuits and Systems II: Express Briefs
IS - 1
ER -