Abstract
The aligned liquid crystals (LCs) display on SiNx thin films using ion-beam (IB) irradiation was studied with controllability of pretilt angle depending on incident energies of the IB. The LCs alignment property for the SiNx thin films were observed to verify the practical application potential. A good LCs alignment of vertical alignment LCs cells on SiNx thin film surfaces irradiated with incident IB energy of 1800 eV was achieved. The atomic force microscopy (AFM) images of LCs on SiNx thin film surfaces irradiated with IB energy was used for the surface analysis.
Original language | English |
---|---|
Pages (from-to) | 76-82 |
Number of pages | 7 |
Journal | Ferroelectrics |
Volume | 396 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2010 |
Bibliographical note
Funding Information:This research was supported by the MKE (The Ministry of Knowledge Economy), Korea under the ITRC (Information Technology Research Center) Support program supervised by the NIPA (National IT Industry Promotion Agency) (NIPA-2009-C1090-0902-0018).
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics