Abstract
The effects of aluminum cathode modification and ion-beam-induced damage in organic light-emitting devices (OLEDs) were investigated. Indium tin oxide (ITO)-coated glass was used as the substrate for the OLEDs in the experiment. The Kaufman ion gun was used to increase depositing aluminum adatom mobility. It was found that energetic particles of Al assisted by an Ar ion might damage the organic material generating undesirable leakage current but substantial improvements in passivation characteristics were observed in ion-beam-assisted deposition (IBAD) devices since the dense Al cathode inhibits the permeation of water and oxygen.
Original language | English |
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Pages (from-to) | 2511-2517 |
Number of pages | 7 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 22 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2004 Sept |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Electrical and Electronic Engineering