Interlayer thermal boundary resistance of WSe2 investigated by using time-domain thermoreflectance measurement

Young Gwan Choi, Chan June Zhung, Chang Jae Roh, Hwi In Ju, Tae Yun Kim, Sang Woo Kim, J. S. Lee

Research output: Contribution to journalConference articlepeer-review

Abstract

Thermal transport phenomena in low-dimensional materials have been attracting lots of attentions because of the heat dissipation problem in their nano-device applications. In this work, we prepared single-layer and double-layer WSe2 ultrathin films, and determined their cross-plane thermal resistance by using the time-domain thermoreflectance measurement technique. We observed that the thermal resistance of the double-layer film is fairly larger than that of the single-layer film, and discussed this intriguing difference by considering a contribution of the thermal boundary conductance at the interface of two WSe2 monolayers.

Original languageEnglish
Pages (from-to)7265-7271
Number of pages7
JournalInternational Heat Transfer Conference
Volume2018-August
DOIs
Publication statusPublished - 2018
Event16th International Heat Transfer Conference, IHTC 2018 - Beijing, China
Duration: 2018 Aug 102018 Aug 15

Bibliographical note

Publisher Copyright:
© 2018 International Heat Transfer Conference. All rights reserved.

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanical Engineering
  • Fluid Flow and Transfer Processes

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