TY - GEN
T1 - Instability of light illumination stress on amorphous InGaZnO thin film transistors
AU - Park, Suehye
AU - Cho, Edward Namkyu
AU - Yun, Ilgu
PY - 2012
Y1 - 2012
N2 - In this paper, the effects of the different wavelengths of light under both positive and negative VGS stresses on amorphous InGaZnO thin film transistors are investigated. The TFT instability depending on optical and electrical stresses can be explained by the charge trapping mechanism and the interface modification.
AB - In this paper, the effects of the different wavelengths of light under both positive and negative VGS stresses on amorphous InGaZnO thin film transistors are investigated. The TFT instability depending on optical and electrical stresses can be explained by the charge trapping mechanism and the interface modification.
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M3 - Conference contribution
AN - SCOPUS:84886937557
SN - 9781627486521
T3 - Proceedings of the International Display Workshops
SP - 317
EP - 320
BT - Society for Information Display - 19th International Display Workshops 2012, IDW/AD 2012
T2 - 19th International Display Workshops in Conjunction with Asia Display 2012, IDW/AD 2012
Y2 - 4 December 2012 through 7 December 2012
ER -
