In-situ tem observation of metal Zn nanocrystal growth on ZnO films

Jong Min Yuk; Kwanpyo Kim; Zonghoon Lee; Masashi Watanabe; Alex Zettl; Jeong Yong Lee; Young Soo No; Tae Whan Kim; Won Kook Choi

doi:10.1017/S1431927609098845

In-situ tem observation of metal Zn nanocrystal growth on ZnO films

Jong Min Yuk, Kwanpyo Kim, Zonghoon Lee, Masashi Watanabe, Alex Zettl, Jeong Yong Lee, Young Soo No, Tae Whan Kim, Won Kook Choi

Department of Physics

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	698-699
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609098845
Publication status	Published - 2009 Jul

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/S1431927609098845

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@article{17a90eb8533447ac9efcc606db42772b,

title = "In-situ tem observation of metal Zn nanocrystal growth on ZnO films",

author = "Yuk, {Jong Min} and Kwanpyo Kim and Zonghoon Lee and Masashi Watanabe and Alex Zettl and Lee, {Jeong Yong} and No, {Young Soo} and Kim, {Tae Whan} and Choi, {Won Kook}",

year = "2009",

month = jul,

doi = "10.1017/S1431927609098845",

language = "English",

volume = "15",

pages = "698--699",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - In-situ tem observation of metal Zn nanocrystal growth on ZnO films

AU - Yuk, Jong Min

AU - Kim, Kwanpyo

AU - Lee, Zonghoon

AU - Watanabe, Masashi

AU - Zettl, Alex

AU - Lee, Jeong Yong

AU - No, Young Soo

AU - Kim, Tae Whan

AU - Choi, Won Kook

PY - 2009/7

Y1 - 2009/7

UR - http://www.scopus.com/inward/record.url?scp=69949169241&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=69949169241&partnerID=8YFLogxK

U2 - 10.1017/S1431927609098845

DO - 10.1017/S1431927609098845

M3 - Article

AN - SCOPUS:69949169241

SN - 1431-9276

VL - 15

SP - 698

EP - 699

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

In-situ tem observation of metal Zn nanocrystal growth on ZnO films

All Science Journal Classification (ASJC) codes

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