Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation

Lee Gon Kim, Seok Yang, Young Gu Kang, Hong Gyu Park, Jin Woo Lee, Dae Shik Seo

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)


This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).

Original languageEnglish
Pages (from-to)176-182
Number of pages7
Issue number1
Publication statusPublished - 2012
Event13th International Conference on Ferroelectric Liquid Crystals - Niagara Falls, ON, Canada
Duration: 2012 Aug 282012 Sept 2

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


Dive into the research topics of 'Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation'. Together they form a unique fingerprint.

Cite this