Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation

Lee Gon Kim; Seok Yang; Young Gu Kang; Hong Gyu Park; Jin Woo Lee; Dae Shik Seo

doi:10.1080/00150193.2012.684989

Homogeneously aligned liquid crystals on a ZrO₂ alignment film using ion-beam irradiation

Lee Gon Kim, Seok Yang, Young Gu Kang, Hong Gyu Park, Jin Woo Lee, Dae Shik Seo

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Conference article › peer-review

4 Citations (Scopus)

Abstract

This paper introduces the characteristics of the zirconium dioxide (ZrO₂) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO₂ layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO₂ surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO₂ thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).

Original language	English
Pages (from-to)	176-182
Number of pages	7
Journal	Ferroelectrics
Volume	431
Issue number	1
DOIs	https://doi.org/10.1080/00150193.2012.684989
Publication status	Published - 2012
Event	13th International Conference on Ferroelectric Liquid Crystals - Niagara Falls, ON, Canada Duration: 2012 Aug 28 → 2012 Sept 2

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1080/00150193.2012.684989

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title = "Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation",

abstract = "This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).",

author = "Kim, {Lee Gon} and Seok Yang and Kang, {Young Gu} and Park, {Hong Gyu} and Lee, {Jin Woo} and Seo, {Dae Shik}",

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note = "13th International Conference on Ferroelectric Liquid Crystals ; Conference date: 28-08-2012 Through 02-09-2012",

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T1 - Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation

AU - Kim, Lee Gon

AU - Yang, Seok

AU - Kang, Young Gu

AU - Park, Hong Gyu

AU - Lee, Jin Woo

AU - Seo, Dae Shik

PY - 2012

Y1 - 2012

N2 - This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).

AB - This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).

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ER -

Homogeneously aligned liquid crystals on a ZrO₂ alignment film using ion-beam irradiation

Abstract

All Science Journal Classification (ASJC) codes

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