Abstract
Nanocrystalline graphene-MoS2 lateral interfaces reveal distinct current-rectified characteristics, similar to a p-n diode, that are seldom observed for the monolayer graphene-MoS2 vertical interface. It is found that the lateral interfaces can increase the Schottky barrier between the graphene and the MoS2 because the metallic MoS2 edges cause charge reordering and a potential shift in the graphene.
Original language | English |
---|---|
Pages (from-to) | 1793-1798 |
Number of pages | 6 |
Journal | Advanced Materials |
Volume | 28 |
Issue number | 9 |
DOIs | |
Publication status | Published - 2016 Mar 2 |
Bibliographical note
Funding Information:This research was financially supported by the Center for Advanced Soft-Electronics as the Global Frontier Project (2013M3A6A5073177), Basic Science Research Program (2009–0083540) through the National Research Foundation (NRF) of Korea Grant funded by the Ministry of Science, ICT & Future Planning and Human Resources Program in Energy Technology of the Korea Institute of Energy Technology Evaluation and Planning (KETEP), granted fi nancial resource from the Ministry of Trade, Industry & Energy, Korea (No. 20154030200870).
Publisher Copyright:
© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering