High-contrast imaging of graphene via time-domain terahertz spectroscopy

J. L. Tomaino; A. D. Jameson; M. J. Paul; J. W. Kevek; A. M. Van Der Zande; R. A. Barton; H. Choi; P. L. McEuen; E. D. Minot; Yun Shik Lee

doi:10.1007/s10762-012-9889-7

High-contrast imaging of graphene via time-domain terahertz spectroscopy

J. L. Tomaino, A. D. Jameson, M. J. Paul, J. W. Kevek, A. M. Van Der Zande, R. A. Barton, H. Choi, P. L. McEuen, E. D. Minot, Yun Shik Lee

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A singlecycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface.We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model.

Original language	English
Pages (from-to)	839-845
Number of pages	7
Journal	Journal of Infrared, Millimeter, and Terahertz Waves
Volume	33
Issue number	8
DOIs	https://doi.org/10.1007/s10762-012-9889-7
Publication status	Published - 2012 Aug

Bibliographical note

Funding Information:
Acknowledgement The work at Oregon State University was supported by Oregon Nanoscience and Microtechnologies Institute, National Science Foundation (DMR-1063632), and National Research Foundation (NRF) of Korea Grant funded by the Korean Government (NRF-2011-220-D00052) which also supported the work at the Yonsei University. The work at the Yonsei University was supported by the Basic Research Program through the NRF of Korea funded by the Ministry of Education, Science, and Technology (2011-0013255). The work at Cornell was supported by the NSF through the Cornell Center for Materials Research (CCMR), the MARCO Focused Research Center on Materials, Structures, and Devices and the AFOSR. Sample Fabrication was performed at the Cornell node of the National Nanofabrication Infrastructure Network, which is supported by the National Science Foundation (Grant ECS-0335765).

All Science Journal Classification (ASJC) codes

Radiation
Instrumentation
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1007/s10762-012-9889-7

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title = "High-contrast imaging of graphene via time-domain terahertz spectroscopy",

abstract = "We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A singlecycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface.We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model.",

author = "Tomaino, {J. L.} and Jameson, {A. D.} and Paul, {M. J.} and Kevek, {J. W.} and {Van Der Zande}, {A. M.} and Barton, {R. A.} and H. Choi and McEuen, {P. L.} and Minot, {E. D.} and Lee, {Yun Shik}",

note = "Funding Information: Acknowledgement The work at Oregon State University was supported by Oregon Nanoscience and Microtechnologies Institute, National Science Foundation (DMR-1063632), and National Research Foundation (NRF) of Korea Grant funded by the Korean Government (NRF-2011-220-D00052) which also supported the work at the Yonsei University. The work at the Yonsei University was supported by the Basic Research Program through the NRF of Korea funded by the Ministry of Education, Science, and Technology (2011-0013255). The work at Cornell was supported by the NSF through the Cornell Center for Materials Research (CCMR), the MARCO Focused Research Center on Materials, Structures, and Devices and the AFOSR. Sample Fabrication was performed at the Cornell node of the National Nanofabrication Infrastructure Network, which is supported by the National Science Foundation (Grant ECS-0335765).",

year = "2012",

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doi = "10.1007/s10762-012-9889-7",

language = "English",

volume = "33",

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AU - Jameson, A. D.

AU - Paul, M. J.

AU - Kevek, J. W.

AU - Van Der Zande, A. M.

AU - Barton, R. A.

AU - Choi, H.

AU - McEuen, P. L.

AU - Minot, E. D.

AU - Lee, Yun Shik

N1 - Funding Information: Acknowledgement The work at Oregon State University was supported by Oregon Nanoscience and Microtechnologies Institute, National Science Foundation (DMR-1063632), and National Research Foundation (NRF) of Korea Grant funded by the Korean Government (NRF-2011-220-D00052) which also supported the work at the Yonsei University. The work at the Yonsei University was supported by the Basic Research Program through the NRF of Korea funded by the Ministry of Education, Science, and Technology (2011-0013255). The work at Cornell was supported by the NSF through the Cornell Center for Materials Research (CCMR), the MARCO Focused Research Center on Materials, Structures, and Devices and the AFOSR. Sample Fabrication was performed at the Cornell node of the National Nanofabrication Infrastructure Network, which is supported by the National Science Foundation (Grant ECS-0335765).

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AB - We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A singlecycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface.We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model.

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High-contrast imaging of graphene via time-domain terahertz spectroscopy

Abstract

Bibliographical note

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