Grain boundary mapping in polycrystalline graphene

Kwanpyo Kim; Zonghoon Lee; William Regan; C. Kisielowski; M. F. Crommie; A. Zettl

doi:10.1021/nn1033423

Grain boundary mapping in polycrystalline graphene

Kwanpyo Kim, Zonghoon Lee, William Regan, C. Kisielowski, M. F. Crommie, A. Zettl

Department of Physics

Research output: Contribution to journal › Article › peer-review

566 Citations (Scopus)

Abstract

We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

Original language	English
Pages (from-to)	2142-2146
Number of pages	5
Journal	ACS Nano
Volume	5
Issue number	3
DOIs	https://doi.org/10.1021/nn1033423
Publication status	Published - 2011 Mar 22

All Science Journal Classification (ASJC) codes

Materials Science(all)
Engineering(all)
Physics and Astronomy(all)

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10.1021/nn1033423

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AU - Lee, Zonghoon

AU - Regan, William

AU - Kisielowski, C.

AU - Crommie, M. F.

AU - Zettl, A.

PY - 2011/3/22

Y1 - 2011/3/22

N2 - We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

AB - We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

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Grain boundary mapping in polycrystalline graphene

Abstract

All Science Journal Classification (ASJC) codes

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