TY - GEN
T1 - Fusing horizontal and vertical components of face images for identity verification
AU - Oh, Beom Seok
AU - Choi, Byung Gue
AU - Toh, Kar Ann
PY - 2009
Y1 - 2009
N2 - This paper presents an empirical investigation of two sparse random projections which correspond to extraction of vertical and horizontal features from a face image for identity verification. In order to enhance the performance of each projection, the matching scores of both directional features are fused via a Total Error Rate minimization. The BERC face database is used for evaluating the effectiveness of the proposed method. Our empirical results show that the proposed vertical projection outperforms the commonly used PCA and a Random Projection algorithm in terms of the Equal Error Rate (EER) measure. The result of fusion shows an even better EER performance than that from each individual projection.
AB - This paper presents an empirical investigation of two sparse random projections which correspond to extraction of vertical and horizontal features from a face image for identity verification. In order to enhance the performance of each projection, the matching scores of both directional features are fused via a Total Error Rate minimization. The BERC face database is used for evaluating the effectiveness of the proposed method. Our empirical results show that the proposed vertical projection outperforms the commonly used PCA and a Random Projection algorithm in terms of the Equal Error Rate (EER) measure. The result of fusion shows an even better EER performance than that from each individual projection.
UR - http://www.scopus.com/inward/record.url?scp=70349325778&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=70349325778&partnerID=8YFLogxK
U2 - 10.1109/ICIEA.2009.5138286
DO - 10.1109/ICIEA.2009.5138286
M3 - Conference contribution
AN - SCOPUS:70349325778
SN - 9781424428007
T3 - 2009 4th IEEE Conference on Industrial Electronics and Applications, ICIEA 2009
SP - 651
EP - 655
BT - 2009 4th IEEE Conference on Industrial Electronics and Applications, ICIEA 2009
T2 - 2009 4th IEEE Conference on Industrial Electronics and Applications, ICIEA 2009
Y2 - 25 May 2009 through 27 May 2009
ER -