Abstract
We describe a three-dimensional microscopy technique based on spectral and frequency encoding. The method employs a wavelength-swept laser to illuminate a specimen with a spectrally-dispersed line focus that sweeps over the specimen in time. The spatial information along each spectral line is further mapped into different modulation frequencies. Spectrally-resolved detection and subsequent Fourier analysis of the backscattered light from the specimen therefore enable high-speed, scanner-free imaging of the specimen with a single-element photodetector. Highcontrast, three-dimensional imaging capability of this method is demonstrated by presenting images of various materials and biological specimens.
Original language | English |
---|---|
Pages (from-to) | 5809-5821 |
Number of pages | 13 |
Journal | Optics Express |
Volume | 23 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2015 |
Bibliographical note
Publisher Copyright:© 2015 Optical Society of America.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics