FDTD characterization of waveguide-probe structures

Tentzeris Emmanouil; Michael Krumpholz; Nihad Dib; Jong Gwan Yook; Linda P.B. Katehi

doi:10.1109/22.721147

FDTD characterization of waveguide-probe structures

Tentzeris Emmanouil, Michael Krumpholz, Nihad Dib, Jong Gwan Yook, Linda P.B. Katehi

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.

Original language	English
Pages (from-to)	1452-1460
Number of pages	9
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	46
Issue number	10 PART 1
DOIs	https://doi.org/10.1109/22.721147
Publication status	Published - 1998

Bibliographical note

Funding Information:
Manuscript received April 8, 1996; revised March 2, 1998. This work was supported by the NATO Science Committee under a scholarship through the German Academic Exchange Service, and by the U.S. Army Research Office.

All Science Journal Classification (ASJC) codes

Radiation
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/22.721147

Cite this

@article{cec38a87b5254d3990b966db4a1979f3,

title = "FDTD characterization of waveguide-probe structures",

abstract = "The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.",

author = "Tentzeris Emmanouil and Michael Krumpholz and Nihad Dib and Yook, {Jong Gwan} and Katehi, {Linda P.B.}",

note = "Funding Information: Manuscript received April 8, 1996; revised March 2, 1998. This work was supported by the NATO Science Committee under a scholarship through the German Academic Exchange Service, and by the U.S. Army Research Office.",

year = "1998",

doi = "10.1109/22.721147",

language = "English",

volume = "46",

pages = "1452--1460",

journal = "IEEE Transactions on Microwave Theory and Techniques",

issn = "0018-9480",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "10 PART 1",

}

TY - JOUR

T1 - FDTD characterization of waveguide-probe structures

AU - Emmanouil, Tentzeris

AU - Krumpholz, Michael

AU - Dib, Nihad

AU - Yook, Jong Gwan

AU - Katehi, Linda P.B.

N1 - Funding Information: Manuscript received April 8, 1996; revised March 2, 1998. This work was supported by the NATO Science Committee under a scholarship through the German Academic Exchange Service, and by the U.S. Army Research Office.

PY - 1998

Y1 - 1998

N2 - The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.

AB - The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.

UR - http://www.scopus.com/inward/record.url?scp=0000759852&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000759852&partnerID=8YFLogxK

U2 - 10.1109/22.721147

DO - 10.1109/22.721147

M3 - Article

AN - SCOPUS:0000759852

SN - 0018-9480

VL - 46

SP - 1452

EP - 1460

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 10 PART 1

ER -

FDTD characterization of waveguide-probe structures

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this