Fault Group Pattern Matching with Efficient Early Termination for High-Speed Redundancy Analysis

Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)


Advances in memory density and capacity have had the consequence of increasing the probability of memory faults. For this reason, redundancy analysis (RA) and repair are used as effective solutions to improve memory yield. However, as the growth of the number of memory cells increases, it causes increase of the number of faulty cells and results in increase of difficulty of fault analysis. Although various RA methodologies have been proposed, most of them require a long analysis time or fast analysis speed without achieving a 100% normalized repair rate. Furthermore, research on conventional RA methodologies has not included effective early termination methods. Therefore, in this paper, fault group pattern matching (FGPM) is proposed for high speed RA with an effective early termination method. It can achieve very fast analysis with a 100% normalized repair rate. Additionally, it can finish the analysis rapidly by the proposed early termination method when a memory cannot be repaired. Experimental results demonstrate that the FGPM is highly effective in reducing analysis time with the achievement of a 100% normalized repair rate. In addition, the effectiveness of the proposed early termination is shown.

Original languageEnglish
Pages (from-to)1473-1482
Number of pages10
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue number7
Publication statusPublished - 2018 Jul

Bibliographical note

Funding Information:
Manuscript received March 20, 2017; revised July 14, 2017; accepted September 20, 2017. Date of publication October 6, 2017; date of current version June 18, 2018. This work was supported by the National Research Foundation of Korea Grant funded by the Korea Government (MSIP) under Grant 2015R1A2A1A13001751. This paper was recommended by Associate Editor A. E. Gattiker. (Corresponding author: Sungho Kang.) The authors are with the Computer Systems Reliable SOC Laboratory, Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea (e-mail: yseehy214@soc.yonsei.ac.kr; ckw1505@soc.yonsei.ac.kr; ddhk@soc.yonsei.ac.kr; shkang@yonsei.ac.kr).

Publisher Copyright:
© 1982-2012 IEEE.

All Science Journal Classification (ASJC) codes

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering


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